Thermal Conductivity Analyzer

Thermal Conductivity Analyzer

A Thermal Conductivity Analyzer lab uses a variety of methods to measure a material’s ability to conduct heat, known as thermal conductivity.
These measurements are crucial for understanding material properties, optimizing designs, and ensuring product performance in various industries.
Common applications include testing insulation materials, evaluating heat sinks, and optimizing thermal management systems in electronics, aerospace, and construction.

The BXT-DRS rapid thermal conductivity tester is a thermal conductivity tester developed
using transient planar heat source technology (TPS), which can be used to test the thermal conductivity of various types of materials. The transient plane heat source method is one of the medium-sized methods for studying the heat conduction performance, which brings the measurement technology to a whole new level. The ability to quickly and accurately measure thermal conductivity when researching materials provides great convenience for enterprise quality monitoring, material production, and laboratory research. The instrument is easy to operate, the method is simple and easy to understand, and will not cause damage to the tested sample.

Thermal Conductivity Analyzer

Test object:
Metals, ceramics, alloys, minerals, polymers, composite materials, paper, fabrics, foam plastics (insulation materials with flat surfaces, plates), mineral wool, cement walls, glass reinforced composite panels CRC, cement polystyrene panels, sandwiches Concrete, fiberglass composite panels, paper honeycomb panels, colloids, liquids, powders, granular and paste solids, etc., are tested in a wide range of objects.

Test Range. 0.005-300W/(m*K)
Measuring temperature range Room temperature— 130℃
Probe diameter No. 1 probe 7.5mm; No. 2 probe 15mm
Precision. ±3%
Repeatability error. ≤3%
Measure time. 5~160s
Power supply. AC 220V
Total power. ﹤ 500w
Sample temperature rise. ﹤ 15℃
Test sample power P
No. 1 probe power 0

Sample specifications
Single sample measured by probe No. 1 (15*15*3.75mm)
A single sample measured by the No. 2 probe (30*30*7.5mm)
Note: The measurement of probe No. 1 is a low-conductivity material with a thinner thickness ≤0.2W/(m*K)).
If the surface of the tested sample is smooth, flat and viscous, the samples can be superimposed

Thermal Conductivity Analyzer